Low-voltage electron diffractive imaging

Imaging electron detectors for low-voltage TEM

Atom-scale ptychographic electron diffractive imaging of boron nitride cones.

Ptychographic coherent diffractive imaging (CDI) has been extensively applied using both x rays and electrons. The extension to atomic resolution has been elusive. This Letter demonstrates ptychographic electron diffractive imaging at atomic resolution, permitting identification of structure in a boron nitride helical cone at a resolution of order 1 Å, beyond that of comparative Z-contrast imag...

10-kV diffractive imaging using newly developed electron diffraction microscope.

A new electron diffraction microscope based on a conventional scanning electron microscope (SEM), for obtaining atomic-level resolution images without causing serious damage to the specimen, has been developed. This microscope in the relatively low-voltage region makes it possible to observe specimens at suitable resolution and record diffraction patterns. Using the microscope we accomplished 1...

Effective Pattern Intensity Artifacts Treatment for Electron Diffractive Imaging

We present a method to treat spurious intensities in electron diffraction experiments. Coherent electron diffraction imaging requires proper data reduction before the application of phase retrieval algorithms. The presence of spurious intensities in the electron diffraction patterns makes the data reduction complicated and time consuming and jeopardizes the application of mathematical constrain...

Phase-diverse coherent diffractive imaging: high sensitivity with low dose.

This Letter demonstrates that coherent diffractive imaging (CDI), in combination with phase-diversity methods, provides reliable and artefact free high-resolution images. Here, using x rays, experimental results show a threefold improvement in the available image contrast. Furthermore, in conditions requiring low imaging dose, it is demonstrated that phase-diverse CDI provides a factor of 2 imp...